BT136-600D,127 Application and Selection Guide
BT136-600D,127 Model and Manufacturer Information
BT136-600D,127, a Triacs manufactured by NXP Semiconductors: BT136-600D,127 helps you confirm the specific model, while NXP Semiconductors helps you confirm the product source. If you are selecting a part, you can first check whether BT136-600D,127 meets your requirements, then check whether NXP Semiconductors matches your expectations, and then refer to TRIAC Diode 600V 4A(RMS) 27A 3-Pin(3+Tab) TO-220AB Rail for further evaluation.
BT136-600D,127 Product Parameters and Description
The main parameters of NXP Semiconductors's Triacs product BT136-600D,127 include TRIAC Diode 600V 4A(RMS) 27A 3-Pin(3+Tab) TO-220AB Rail. This is a Triacs produced by NXP Semiconductors, and it also offers good applicability in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices.
BT136-600D,127 Application and Selection Reference
NXP Semiconductors's Triacs product BT136-600D,127 has a relatively wide range of applications in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices. Overall, BT136-600D,127 is a Triacs solution worth considering, and manufacturer NXP Semiconductors provides long-term supply program support for this product, which helps ensure supply continuity during mass production.
Recommended Part Numbers for BT136-600D,127
Designers looking for BT136-600D,127 recommended parts can evaluate the following options. BT136-600D,127 selection decisions should verify parameters, tolerance and packaging against the original design bill of materials.
| Recommended Part |
Brand |
Package |
Description |
| BTA225B-600B,118 |
NXP Semiconductors |
|
双向可控硅 TAPE13 3Q TRIAC |
| BT134-600E,127 |
NXP Semiconductors |
|
双向可控硅 RAIL TRIAC |
| BT151S-650R |
NXP Semiconductors |
|
Silicon Controlled Rectifier, 12A I(T)RMS, 650V V(DRM), 650V V(RRM), 1 Element, TO-252AA, PLASTIC, SC-63, TO-252, DPAK-3/2 |
EZKEY can provide BT136-600D,127 recommended part comparison data and engineering samples for evaluation.