BAS516,L3F Application and Selection Guide
BAS516,L3F Model and Manufacturer Information
BAS516,L3F, a Schottky Diodes & Rectifiers manufactured by Toshiba Semiconductor and Storage: BAS516,L3F helps you confirm the specific model, while Toshiba Semiconductor and Storage helps you confirm the product source. If you are selecting a part, you can first check whether BAS516,L3F meets your requirements, then check whether Toshiba Semiconductor and Storage matches your expectations, and then refer to DIODE GEN PURP 100V 250MA ESC for further evaluation.
BAS516,L3F Product Parameters and Description
The main parameters of Toshiba Semiconductor and Storage's Schottky Diodes & Rectifiers product BAS516,L3F include DIODE GEN PURP 100V 250MA ESC. This is a Schottky Diodes & Rectifiers produced by Toshiba Semiconductor and Storage, and it also offers good applicability in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices.
BAS516,L3F Application and Selection Reference
Toshiba Semiconductor and Storage's Schottky Diodes & Rectifiers product BAS516,L3F has a relatively wide range of applications in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices. Overall, BAS516,L3F is a Schottky Diodes & Rectifiers solution worth considering, and manufacturer Toshiba Semiconductor and Storage provides long-term supply program support for this product, which helps ensure supply continuity during mass production.
Recommended Part Numbers for BAS516,L3F
Designers looking for BAS516,L3F recommended parts can evaluate the following options. BAS516,L3F selection decisions should verify parameters, tolerance and packaging against the original design bill of materials.
| Recommended Part |
Brand |
Package |
Description |
| 1N5819 |
Toshiba Semiconductor and Storage |
|
直流反向耐压(Vr):40V 平均整流电流(Io):1A 正向压降(Vf):600mV@1A |
| 1N5822(SS34) |
Toshiba Semiconductor and Storage |
|
IC |
EZKEY can provide BAS516,L3F recommended part comparison data and engineering samples for evaluation.