71V30S55TFG Application and Selection Guide
71V30S55TFG Model and Manufacturer Information
71V30S55TFG, a SRAM manufactured by IDT, Integrated Device Technology Inc: 71V30S55TFG helps you confirm the specific model, while IDT, Integrated Device Technology Inc helps you confirm the product source. If you are selecting a part, you can first check whether 71V30S55TFG meets your requirements, then check whether IDT, Integrated Device Technology Inc matches your expectations, and then refer to IC SRAM 8KBIT 55NS 64TQFP for further evaluation.
71V30S55TFG Product Parameters and Description
The main parameters of IDT, Integrated Device Technology Inc's SRAM product 71V30S55TFG include IC SRAM 8KBIT 55NS 64TQFP. This is a SRAM produced by IDT, Integrated Device Technology Inc, and it also offers good applicability in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices.
71V30S55TFG Application and Selection Reference
IDT, Integrated Device Technology Inc's SRAM product 71V30S55TFG has a relatively wide range of applications in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices. Overall, 71V30S55TFG is a SRAM solution worth considering, and manufacturer IDT, Integrated Device Technology Inc provides long-term supply program support for this product, which helps ensure supply continuity during mass production.
Recommended Part Numbers for 71V30S55TFG
Designers looking for 71V30S55TFG recommended parts can evaluate the following options. 71V30S55TFG selection decisions should verify parameters, tolerance and packaging against the original design bill of materials.
| Recommended Part |
Brand |
Package |
Description |
| 71V256SA15YG |
IDT, Integrated Device Technology Inc |
|
IC SRAM 256K PARALLEL 28SOJ |
| 71V416L10PHG |
IDT, Integrated Device Technology Inc |
|
IC SRAM 4M PARALLEL 44TSOP II |
| 71V416S10PHG |
IDT, Integrated Device Technology Inc |
|
IC SRAM 4M PARALLEL 44TSOP II |
EZKEY can provide 71V30S55TFG recommended part comparison data and engineering samples for evaluation.