VL53L3CXV0DH/1 Application and Selection Guide
VL53L3CXV0DH/1 Model and Manufacturer Information
VL53L3CXV0DH/1, a General Purpose Semiconductors manufactured by STMicroelectronics: VL53L3CXV0DH/1 helps you confirm the specific model, while STMicroelectronics helps you confirm the product source. If you are selecting a part, you can first check whether VL53L3CXV0DH/1 meets your requirements, then check whether STMicroelectronics matches your expectations, and then refer to TIME-OF-FLIGHT PROXIMITY SENSOR for further evaluation.
VL53L3CXV0DH/1 Product Parameters and Description
The main parameters of STMicroelectronics's General Purpose Semiconductors product VL53L3CXV0DH/1 include TIME-OF-FLIGHT PROXIMITY SENSOR. This is a General Purpose Semiconductors produced by STMicroelectronics, and it also offers good applicability in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices.
VL53L3CXV0DH/1 Application and Selection Reference
STMicroelectronics's General Purpose Semiconductors product VL53L3CXV0DH/1 has a relatively wide range of applications in embedded systems, common 3C electronics, automotive electronics, electronic devices, and IoT devices. Overall, VL53L3CXV0DH/1 is a General Purpose Semiconductors solution worth considering, and manufacturer STMicroelectronics provides long-term supply program support for this product, which helps ensure supply continuity during mass production.
Recommended Part Numbers for VL53L3CXV0DH/1
Designers looking for VL53L3CXV0DH/1 recommended parts can evaluate the following options. VL53L3CXV0DH/1 selection decisions should verify parameters, tolerance and packaging against the original design bill of materials.
| Recommended Part |
Brand |
Package |
Description |
| L6205D |
STMicroelectronics |
|
IC MOTOR DRIVER PAR 20SOIC |
| M95320-DRMN3TP/K |
STMicroelectronics |
|
IC EEPROM 32K SPI 20MHZ 8SO |
| STM6505RCABDG6F |
STMicroelectronics |
|
IC SMART RESET DUAL PB 8TDFN |
EZKEY can provide VL53L3CXV0DH/1 recommended part comparison data and engineering samples for evaluation.